Probing the Effects of Dimethyl Aluminum Isopropoxide Surface Reaction Byproducts on Atomic Layer Deposition Nucleation (2025)

    Surfaces, Interfaces, and Applications

    • Jessica C. Jones

      Jessica C. Jones

      Materials Science Division, Argonne National Laboratory, Lemont, Illinois 60439, United States

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    • Jiayi Xu

      Jiayi Xu

      Chemical Sciences and Engineering Division, Argonne National Laboratory, Lemont, Illinois 60439, United States

      More by Jiayi Xu

    • Chang Yan

      Chang Yan

      Chemical Sciences and Engineering Division, Argonne National Laboratory, Lemont, Illinois 60439, United States

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    • Chunxin Luo

      Chunxin Luo

      Materials Science Division, Argonne National Laboratory, Lemont, Illinois 60439, United States

      Illinois Institute of Technology, Chicago, Illinois 60616, United States

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    • Ashley R. Bielinski

      Ashley R. Bielinski

      Materials Science Division, Argonne National Laboratory, Lemont, Illinois 60439, United States

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    • Mark Muir

      Mark Muir

      Materials Science Division, Argonne National Laboratory, Lemont, Illinois 60439, United States

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    • Adam S. Hock

      Adam S. Hock

      Materials Science Division, Argonne National Laboratory, Lemont, Illinois 60439, United States

      Illinois Institute of Technology, Chicago, Illinois 60616, United States

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    • Cong Liu

      Cong Liu

      Chemical Sciences and Engineering Division, Argonne National Laboratory, Lemont, Illinois 60439, United States

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    • Alex B. F. Martinson*

      Alex B. F. Martinson

      Materials Science Division, Argonne National Laboratory, Lemont, Illinois 60439, United States

      *Email: [emailprotected]

      More by Alex B. F. Martinson

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    ACS Applied Materials & Interfaces

    Cite this: ACS Appl. Mater. Interfaces 2025, XXXX, XXX, XXX-XXX

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    https://pubs.acs.org/doi/10.1021/acsami.5c00901

    Published April 22, 2025

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    Probing the Effects of Dimethyl Aluminum Isopropoxide Surface Reaction Byproducts on Atomic Layer Deposition Nucleation (10)

    Atomic layer deposition (ALD) processes that leverage a myriad of metal–organic and complementary reactant combinations have been identified to realize precise and conformal thin film growth. However, the effects of the ALD reaction byproducts on nucleation and growth mechanisms are rarely considered. Site-selective ALD processes provide an opportunity for the detailed investigation of uniform surface sites with atomistic accuracy. Intentional pretreatment with a known ALD reaction byproduct – isopropanol – enables a significant improvement in the nucleation rate reproducibility of dimethylaluminum isopropoxide and water ALD on rutile TiO2(110). In situ spectroscopic ellipsometry reveals a partially reversible byproduct binding that is site-selective for TiO2(110) surface oxygen vacancies. First-principles calculations reveal surface site-specific thermodynamics for adsorption of isopropanol and water that may influence ALD nucleation. The sensitivity of site-selective ALD motivates consideration of secondary surface reactions when designing precision deposition processes, including area- or site-selective ALD reactions.

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    © 2025 UChicago Argonne, LLC., Operators of Argonne National Laboratory. Published by American Chemical Society

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    • Atomic layer deposition
    • Byproducts
    • Nucleation
    • Oxides
    • Thickness

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    ACS Applied Materials & Interfaces

    Cite this: ACS Appl. Mater. Interfaces 2025, XXXX, XXX, XXX-XXX

    Click to copy citationCitation copied!

    Published April 22, 2025

    Publication History

    • Received

    • Accepted

    • Revised

    • Published

      online

    © 2025 UChicago Argonne, LLC., Operators of Argonne National Laboratory. Published by American Chemical Society

    Request reuse permissions

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